
An overview of project activities in the RF & Microwave Laboratory.
S-parameter traceability
Since 2006 the laboratory is involved in a series of projects with partners from industry and academia to improve the quality of coaxial measurements with vector network analyzers (VNA). It has established SI traceability through the mechanical characterization of calculable primary calibration standards, not only airlines but also offset shorts. It has investigated the effects of connectors with the help of numerical EM field simulations. It has invented new calibration algorithms for the electrical characterization of the primary standards.
The work has resulted in a more accurate definition of the 50 Ohm reference plane of a VNA after calibration. It has eliminated inconsistencies between different calibration schemes and has led to a better understanding and control of influences that affect VNA measurements. An important supporting role in this process plays the VNA metrology software VNA Tools.
The laboratory is currently extending its measurement capabilities to 220 GHz or even 250 GHz by establishing traceability for the new PC-0.5 mm connector. This is done in the framework of the RF46G project and in close cooperation with Keysight Technologies.
Partner
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Keysight Technologies
A leading manufacturer of test and measurement equipment
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Huber + Suhner
A leading supplier of components and system solutions for electrical and optical transportation of data and energy.
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ETH Zurich
One of the leading international universities for technology and the natural sciences.
Selected publications
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Establishing traceability for the measurement of scattering parameters in coaxial line systems
M. Zeier, J. Hoffmann, P. Huerlimann, J Ruefenacht, D. Stalder, M. Wollensack; Metrologia 55 (2018) S23 – S36
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Mastering the coaxial 1.0 mm connector interface (PDF, 422 kB, 06.06.2024)
M. Zeier; METinfo 2/2016
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The Curious Mating Habits of Coaxial Connectors (PDF, 251 kB, 06.07.2020)
J. Hoffmann and J. Ruefenacht; METinfo, Vol17, No. 3, 2010.
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Traceable S-parameter measurements in coaxial transmission lines up to 70 GHz (PDF, 2 MB, 06.07.2020)
J. Hoffmann; Dissertation ETH no. 18593, October 2009
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METAS.UncLib
A generic measurement uncertainty calculator
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METAS VNA Tools
A metrology software software for the vector network analyzer
Selected publications
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VNA Tools - A Metrology Software Supporting the Digital Traceability Chain
M. Zeier, M. Wollensack, J. Hoffmann, P. Morrissey, J. Ruefenacht, D. Stalder, Metrology 2025, 5, 72
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Contemporary evaluation of measurement uncertainties in vector network analysis
M. Zeier, J. Hoffmann, J. Ruefenacht, M. Wollensack; Cal Lab: The international journal of metrology, Oct – Dec 2018, p. 22 – 31 Technisches Messen 84, 5 (2017) 348 – 358
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Metas.UncLib - a measurement uncertainty calculator for advanced problems
M. Zeier, J. Hoffmann, M. Wollensack; Metrologia 49 (2012) 809-815
Partner
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Rohde & Schwarz
A leading manufacturer of test and measurement equipment
RF+MW Power
The laboratory has extended its power measurement capabilities in the coaxial line system to 110 GHz in collaboration with industry. The software has been modernized by using synergies with METAS UncLib and METAS VNA Tools. Current R&D work is exploring the possibility to employ the electro-optical effect for a novel power standard in the coaxial line system. This work is carried out in the frame work of an Innosuisse project in collaboration with an industrial partner.
Terahertz Metrology
METAS has explored the 500 to 750 GHz wave guide band in the project TEMMT. This included traceability for S-parameter, power and material parameter measurements in rectangular wave guide. The activity was performed in METAS has explored the 500 to 750 GHz wave guide band in the project TEMMT. This included traceability for S-parameter, power and material parameter measurements in rectangular wave guide. The activity was performed in collaboration with the photonics, time & frequency lab at METAS, which addressed the traceability of the generation and detection of THz frequencies in free field using laser based approaches.
This activity is currently not pursued further.
Projects
Electrical Nanometrology
Near field scanning microwave microscopy (NFSMM) is a fairly novel measurement technique that combines an atomic force microscope (AFM) with a vector network analyzer (VNA). The device can be used to characterize electromagnetic material parameters at the nanoscale. Further information can be found here.
Quantum Sensing with Rydberg atoms
METAS is establishing quantum sensing activities. A dedicated laboratory is being set up for that purpose. The first step aims at using atomic Rydberg states to detect electro-magnetic field patterns on planar circuits. The goal is to explore alternative on-wafer probing techniques with the help of quantum effects. This is pursued within the project OnMicro.
Data Science for Metrology
The Horizon Europe project Digicell deals with digital modelling to support battery manufacturing and testing. The RF&MW lab is dealing with the analysis of electrochemical impedance spectra by means of machine learning algorithms.
Projects
Last modification 24.04.2026
Contact
Federal Institute of Metrology
Laboratory RF and Microwave
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